System on Chip Test Architectures

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  • Publisher : Morgan Kaufmann
  • Release : 28 July 2010
  • ISBN : 0080556809
  • Page : 896 pages
  • Rating : 4.5/5 from 103 voters

System on Chip Test Architectures Book PDF summary

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

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System-on-Chip Test Architectures

System-on-Chip Test Architectures
  • Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
  • Publisher : Morgan Kaufmann
  • Release Date : 2010-07-28
  • ISBN : 0080556809
DOWNLOAD BOOKSystem-on-Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization
  • Author : Erik Larsson
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-03-30
  • ISBN : 9780387256245
DOWNLOAD BOOKIntroduction to Advanced System-on-Chip Test Design and Optimization

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques

Design and Test Technology for Dependable Systems-on-chip

Design and Test Technology for Dependable Systems-on-chip
  • Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
  • Publisher : IGI Global
  • Release Date : 2011-01-01
  • ISBN : 9781609602147
DOWNLOAD BOOKDesign and Test Technology for Dependable Systems-on-chip

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

System-on-Chip

System-on-Chip
  • Author : Bashir M. Al-Hashimi
  • Publisher : IET
  • Release Date : 2006-01-01
  • ISBN : 9780863415524
DOWNLOAD BOOKSystem-on-Chip

System-on-Chip (SoC) represents the next major market for microelectronics, and there is considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. SoC is an expanding field, at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum which includes books, journals, and conference proceedings. The book provides a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas, provided by leading experts

VLSI-SOC: From Systems to Chips

VLSI-SOC: From Systems to Chips
  • Author : Manfred Glesner,Ricardo Reis,Leandro Indrusiak,Vincent Mooney,Hans Eveking
  • Publisher : Springer
  • Release Date : 2006-08-16
  • ISBN : 9780387334035
DOWNLOAD BOOKVLSI-SOC: From Systems to Chips

This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of Darmstadt, Germany (December 1-3, 2003). Previous conferences have taken place in Edinburgh (81), Trondheim (83), Tokyo (85), Vancouver (87), Munich (89), Edinburgh (91), Grenoble (93), Tokyo (95), Gramado (97), Lisbon (99)andMontpellier(01). The purpose of this conference, sponsored by IFIP TC 10

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
  • Author : Krishnendu Chakrabarty
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-04-17
  • ISBN : 9781475765274
DOWNLOAD BOOKSOC (System-on-a-Chip) Testing for Plug and Play Test Automation

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and

Advances in Electronic Testing

Advances in Electronic Testing
  • Author : Dimitris Gizopoulos
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-01-22
  • ISBN : 9780387294094
DOWNLOAD BOOKAdvances in Electronic Testing

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

VLSI-SoC: Advanced Topics on Systems on a Chip

VLSI-SoC: Advanced Topics on Systems on a Chip
  • Author : Ricardo Reis,Vincent Mooney,Paul Hasler
  • Publisher : Springer
  • Release Date : 2009-04-05
  • ISBN : 9780387895581
DOWNLOAD BOOKVLSI-SoC: Advanced Topics on Systems on a Chip

This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working